Olympus GX51 inverted optical microscope
Purpose
Optical analysis of metallographic specimens. Capable of brightfield, darkfield, DIC, and simple polarization observations
Specifications
- — General optical microscopy
- — X1000 magnification
- — AnalSIS software embedded
- — Single lever switchover for brightfield/darkfield observation
Lab: AFRC - Materials capability
Location: AFRC
85 inchinnan drive
Owner: NMIS Enquiries85 inchinnan drive
Further information
Knowledgebase