X-ray Diffractometer (XRD)
Suitable for metals and ceramics, at ambient and high temperatures (up to 2000°C). Specimens can be in bulk or powder form, thin films, corrosion products or debris.
Measured Properties:
- Phase composition
- Crystal structure
- Lattice parameters & mismatches
- Spatial orientation of crystals
- Crystallinity
- Residual stress
- Grain texture
- Layer thickness
Lab: Advanced Materials Research Laboratory (AMRL) - Characterisation Laboratory
Location: James Weir Building
G1 1XJ
Owner: Advanced Materials Research Laboratory (AMRL)G1 1XJ
Contact: Advanced Materials Research Laboratory (AMRL)
Further information
Knowledgebase