Scanning Electron Microscope

The JSM-5600 is a conventional SEM with a tungsten filament electron source. It is equipped with a secondary electron detector for topographic contrast imaging and an Oxford Inca EDX system for compositional analysis.

Specifications:

Resolution: 5 nm 
Probe Current: 10^-12-10^-6 A
Accelerating Voltage: 0.5-30 kV
Specimen Size: 125 mm
Detectors: SE, EDX

More details are avaiable via the St Andrews Electron Microscope Facility