AFM

CSI Nano-observer


Can measure in the contact, tapping, and force modulation modes. Current-sensing contact-mode AFM is not possible now, but the instrument can be upgraded. Maximum area to be scanned is 100 micrometers. Highest possible resolution depends on samples, tip used, and measurement mode. Can reach the nanometre range. Cost of tips to be covered (ca. £30 per tip)



Lab: afm Aberdeen
Location: University of Aberdeen
King's College, Aberdeen AB24 3FX
Owner: Angel Cuesta
Contact: Angel Cuesta

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